Lehrstuhl für Fertigungstechnologie, Universität Erlangen-Nürnberg

Optical Measurement of SMD-Leads

Project Status: finished


Within this research topic a novel measurement system for lead-geometry-inspection of SMDs was developed. In opposite to actually employed systems the normal direction of the device and the camera-axis do not run parallel. The device is tilted twice against the camera-axis. As a result a 2=D-linescan-image of the leads of one side of the device is obtained. Parameters such as lead-length, -width and the pitch can be extracted directly from the image. Additionally the image contains information about the three possible directions in which the lead could be rotated. At first the evaluation is limited to the survey of the periodicity of the lead-comb. This is done by a wavelet analysis of several columns of the image. The accurate inspection of the extracted irregularities will be performed after an edge-detection Sobel-filtering of the interesting areas.



    • Degner, J.; Herrmann, J.; Junker, F.; Berendt, E.; Merklein, M.:
      Leichtbauwerkstoffe für den modernen Automobilbau.
      Zeitschrift Konstruktion 3(2018), pp. 50-54

    Letztes Update: 28.04.2010